Document Type
Article
Date
5-15-1995
Keywords
Aluminium; Annealing; Clusters; Vacancies
Disciplines
Chemistry
Description/Abstract
We investigated the applicability of a model based on fractals and the Smoluchowski kinetic equations to describe hillock formation in thin metal films. We have previously used this model to analyze cluster and ultrafine particle production. We show how to extract two parameters from measured hillock size distributions which may reveal the scaling of the mobility of clusters and vacancies in films with varying hillock size. On the basis of our application of this model to certain data taken from the literature, the model shows considerable potential for being able to provide an internally consistent quantitative basis for monitoring thermally driven mass redistribution processes in metal films.
Recommended Citation
Chaiken, Joseph and Goodisman, Jerry, "Use of fractals and kinetic equations to model thermally induced hillock formation and growth in thin metal films" (1995). Chemistry - All Scholarship. 92.
https://surface.syr.edu/che/92
Source
local input
Creative Commons License
This work is licensed under a Creative Commons Attribution 3.0 License.
Additional Information
Copyright 1995 Thin Solid Films. This article may be downloaded for personal use only. Any other use requires prior permission of the author and Thin Solid Films.
The article may be found athttp://www.sciencedirect.com/science/article/pii/0040609094064792