Document Type

Report

Date

Spring 3-30-1992

Embargo Period

7-6-2012

Keywords

fault coverage, analog circuits, fault simulation, fault dictionary

Language

English

Disciplines

Electrical and Computer Engineering | Electrical and Electronics

Description/Abstract

This report describes an effort to develop a technique for measuring the amount of fault detection coverage that an analog test pattern has for a particular analog device. The technique is based on a software tool which statistically analyzes data from a circuit simulator. One example of a fault simulation experiment is presented, and some of the results are discussed. Finally, some ideas for future work in this area are given.

Source

harvest source

 
 

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