Document Type

Article

Date

1995

Embargo Period

1-2012

Keywords

Field-Programmable Gate Arrays, FPGAs, FPGA faults, Simulation

Language

English

Disciplines

Computer Sciences

Description/Abstract

Although Field-Programmable Gate Arrays (FPGAs) are tested by their manufacturers prior to shipment, they are still susceptible to failures in the field. In this paper, test vectors generated for the emulated (i.e., mission) circuit are fault simulated on two different models: the original view of the circuit, and the design as it is mapped to the FPGA's logic cells. Faults in the cells and in the programming logic are considered. Experiments show that this commonly-used approach fails to detect most of the faults in the FPGA.

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