Title

Analysis Of Slit-Distorted Small-Angle X-Ray Scattering Intensities Without Desmearing

Author(s)/Creator(s)

Jerry Goodisman, Syracuse UniversityFollow
F. Delaglio, Syracuse University
H. Brumberger, Syracuse University

Document Type

Article

Date

2-25-1986

Keywords

Desmearing, X-Rays

Disciplines

Chemistry

Description/Abstract

Experimental small-angle X-ray scattering intensities, generated from a primary beam of known intensity profile, are often 'desmeared' to obtain point-collimated intensities. A much simpler way is shown of using the known beam intensity profile to derive, from the experimental scattering intensity, the quantities required for calculation of surface areas.

Additional Information

Copyright 1986 Journal of Applied Crystallography. This article may be downloaded for personal use only. Any other use requires prior permission of the author and Journal of Applied Crystallography.

The article may be found at http://journals.iucr.org/j/issues/1986/04/00/a26361/a26361.pdf

Recommended Citation

Goodisman, Jerry; Delaglio, F.; and Brumberger, H., "Analysis Of Slit-Distorted Small-Angle X-Ray Scattering Intensities Without Desmearing" (1986). Chemistry - All Scholarship. 11.
https://surface.syr.edu/che/11

Source

local input

Creative Commons License

This work is licensed under a Creative Commons Attribution 3.0 License.